K. Geerlings, S. Shankar, E. Edwards, L. Frunzio, R. J. Schoelkopf, M. H. Devoret
Applications in quantum information processing and photon detectors are stimulating a race to produce the highest possible quality factor on-chip superconducting microwave resonators. We have tested the surface-dominated loss hypothesis by systematically studying the role of geometrical parameters on the internal quality factors of compact resonators patterned in Nb on sapphire. Their single-photon internal quality factors were found to increase with the distance between capacitor fingers, the width of the capacitor fingers, and the impedance of the resonator, achieving quality factors as high as 500,000. With no ion-milling of the sapphire, the internal quality factors drop by roughly a factor of four. All of these results are consistent with our starting hypothesis.
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http://arxiv.org/abs/1204.0742
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