Thursday, June 28, 2012

1206.6275 (B. Gross et al.)

Electrothermal domains in stacks of intrinsic Josephson junctions in
Bi2Sr2CaCu2O8
   [PDF]

B. Gross, S. Guenon, J. Yuan, M. Y. Li, J. Li, A. Iishi, R. G. Mints, T. Hatano, P. H. Wu, D. Koelle, H. B. Wang, R. Kleiner
We have studied experimentally and numerically temperature profiles and the formation of electrothermal domains ("hot spots") in Bi2Sr2CaCu2O8 intrinsic Josephson junction stacks. We show that electrothermal domains dominantly arise from an interplay of Joule heating, caused by the outof- plane resistance of the stacks, and the in-plane as well as the out-of-plane thermal conductivity of Bi2Sr2CaCu2O8. By contrast, the superconducting transition is not essential for the electrothermal domain formation and as a result the maximum temperature of the hot domains is not necessarily above the superconducting transition temperature Tc. Still, in most cases this maximum temperature is considerable above Tc. In simulations, we reproduce numerous effects experimentally observed in previous papers on hot spot formation in intrinsic Josephson junction stacks, making us confident that the description given in this paper captures the essential physics.
View original: http://arxiv.org/abs/1206.6275

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