Friday, August 3, 2012

1208.0280 (S. Scharinger et al.)

Critical current vs. magnetic field dependence in ramp-zigzag Josephson
junctions
   [PDF]

S. Scharinger, M. Turad, A. Stoehr, V. Leca, E. Goldobin, R. G. Mints, D. Koelle, R. Kleiner
We study the critical current I_c dependence on applied magnetic field H for multifacet YBa_2Cu_3O_{7-\delta}-Au-Nb zigzag Josephson junctions. For many experiments one would like to apply a homogeneous field parallel to the junction plane. However, even tiny misalignments can cause drastic deviations from homogeneity. We show this explicitly by measuring and analyzing I_c vs. H for an 8 facet junction, forming an array of 4\times(0-\pi)-segments. The facet width is 10\mu m. H is applied under different angles \theta relative to the substrate plane and different angles \phi relative to the in-plane orientation of the zigzags. We find that even a small misalignment \theta \sim 0.2^\circ can cause a substantial inhomogeneity of the flux density inside the junction, drastically altering its I_c vs. H interference pattern. We also show, that there is a dead angle \theta_d of similar magnitude, where the average flux density completely vanishes.
View original: http://arxiv.org/abs/1208.0280

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