1208.3318 (P. K. Rout et al.)

Electronic reconstruction and enhanced superconductivity at
La$_{1.6-x}$Nd$_{0.4}$Sr$_{x}$CuO$_{4}$/La$_{1.55}$Sr$_{0.45}$CuO$_{4}$
bilayer interface    [PDF]

P. K. Rout, P. C. Joshi, Rajni Porwal, R. C. Budhani

We report enhanced superconductivity in bilayer thin films consisting of superconducting La$_{1.6-x}$Nd$_{0.4}$Sr$_{x}$CuO$_{4}$ with 0.06 $\leq x<$ 0.20 and metallic but non-superconducting La$_{1.55}$Sr$_{0.45}$CuO$_{4}$. These bilayers show a maximum increase in superconducting transition temperature ($T_c$) of more than 200% for $x$ = 0.06 while no change in $T_c$ is observed for the bilayers with $x\geq$ 0.20. The analysis of the critical current and kinetic inductance data suggests 2-3 unit cells thick interfacial layer electronically perturbed to have a higher $T_c$. A simple charge transfer model with cation intermixing explains the observed $T_c$ in bilayers. Still the unusually large thickness of interfacial superconducting layers can not be explained in terms of this model. We believe the stripe relaxation as well as the proximity effect also influence the superconductivity of the interface.

View original: http://arxiv.org/abs/1208.3318