Wednesday, December 19, 2012

1212.4434 (P. C. J. J. Coumou et al.)

Microwave properties of superconducting atomic-layer deposited TiN films    [PDF]

P. C. J. J. Coumou, M. R. Zuiddam, E. F. C. Driessen, P. J. de Visser, J. J. A. Baselmans, T. M. Klapwijk
We have grown superconducting TiN films by atomic layer deposition with thicknesses ranging from 6 to 89 nm. This deposition method allows us to tune the resistivity and critical temperature by controlling the film thickness. The microwave properties are measured, using a coplanar-waveguide resonator, and we find internal quality factors above a million, high sheet inductances (5.2-620 pH), and pulse response times up to 100 \mu s. The high normal state resistivity of the films (> 100 \mu\Omega cm) affects the superconducting state and thereby the electrodynamic response. The microwave response is modeled using a quasiparticle density of states modified with an effective pair-breaker,consistently describing the measured temperature dependence of the quality factor and the resonant frequency.
View original: http://arxiv.org/abs/1212.4434

No comments:

Post a Comment